سیستم رویت نقص اتصال داخلی برای قطعات نیمه هادی HITACHI

Atmosphere: controlled atmosphere

Function: annealing

Heat source: electric

Options: for stators

Type: roller

Applications: for production

Measured material: for unpatterned wafers

Measured physical value: geometry

Options: wafer

Test type: internal bond

Tested product: coil

Operational mode: semi-automatic

Options: for wafers

Technique: reflow

Test material: printed circuit