سیستم رویت نقص اتصال داخلی برای قطعات نیمه هادی HITACHI

Applications: process, for the semiconductor industry

Measured value: wavelength

Other characteristics: modular

Technology: laser

Operational mode: semi-automatic

Options: for wafers

Technique: reflow

Test material: printed circuit

Options: quality, for LEDs

Other characteristics: mobile

Technology: digital, optical

Type: soldering, portable, BGA, video

Test type: magnetic field